Michigan-based k-Space Associates, a worldwide supplier of a wide range of thin-film characterization tools, will be represented through its distributor R-DEC at the microelectronics trade-show and symposium Semicon Japan 2018, which will take place December 12-14 in Tokyo, Japan.
k-Space was founded in 1992 and has since become a leading manufacturer of metrology tools for the thin-film, semiconductor, and photovoltaic industries. Stop by at the R-DEC booth to learn about metrology tools, such as the kSA Emissometer, an ex situ tool that provides MOCVD fabs with essential wafer carrier characterization.
“The real advantage of the kSA Emissometer is that it provides fabs with systematic carrier data that can be integrated into their quality control processes. It also provides a go-no-go decision on carrier use and quantitative determination of the carrier emissivity, allowing for temperature set-point adjustments for individual carriers. In the end, this will lead to lower production costs and better device yields,” according to k-Space.