Experts from around the world will come to Shanghai, China, from September 2 to September 7 to attend the 20th International Conference on Molecular Beam Epitaxy, ICMBE. They will discuss recent advances in MBE techniques and exhibit innovative new devices.
Among the exhibitors is k-Space Associates, a leading manufacturer of in situ, in-line, and ex situ metrology tools for the semiconductor, thin-film, and photovoltaic industries. The kSA RateRat Pro, for example, is an advanced tool for thin-film deposition rate monitoring and is compatible with any type of deposition method, including MBE.
The highlight of ICMBE 2018 will be a presentation by the “Father of MBE,” Al Cho, on the historical development of the MBE technique.